The Federal Circuit's decision in Sigray, Inc. v. Carl Zeiss X-Ray Microscopy highlighted a pivotal issue regarding implicit claim construction in patent law. The court ruling scrutinized how the Patent Trial and Appeal Board (PTAB) interpreted prior art, establishing that such interpretations can effectively amount to implicit claim constructions, even if not requested by either party. The case referenced the SmithKline Beecham precedent on inherency, affirming that detectable features, albeit minor, can influence claim assessments, ultimately allowing for broader interpretations than previously recognized by the PTAB.
The Federal Circuit established a precedent regarding implicit claim construction, emphasizing the importance of prior art interpretations that were not explicitly requested by parties.
The appellate court pointed out that the PTAB's interpretation was an implicit claim construction and cited the SmithKline Beecham decision as a critical precedent.
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